PJB-2019-263
Specify of the best durum wheat cultivar based on multiple traits with Genotype by Yield *Trait (GYT) Biplot
Enver Kendal
Abstract
Specification of the best convenient cultivars based on the multiple trait index is a new approach in studies of adaptation and stability of durum wheat and other cereal crops. For this purpose in the study, the genotype by yield*trait (GYT) biplot new approach was used to identify the best cultivar among 10 durum wheat cultivars based on multi (eight) environments and multi(eighteen)traits. The ranking of cultivars were examined by a superiority index of combining yield and other target traits with GYT biplot. The general adaptability of each cultivar in terms of all traits indicated differences based on average of environments and significant differences were found between varieties in terms of GYT biplot. In GYT biplot, yield-trait combinations indicated the most stable cultivars as sharply, whereas in the GT biplot, the best cultivars were not defined for all traits. The Sarıçanak cultivar ranked as the best in combination of the physio-morphological traits with grain yield, while the Zühre variety was the best for more quality traits and Güneyyıldızı for both physio-morphological and quality traits in GYT biplot. GYT biplot has shown that the combination of traits with yield can support to see visually the best cultivars than GT biplot.
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