PJB-2019-625
Genetic Divergence Analysis for Grain Yield and its components in Bread Wheat (Triticum aestivum L.)
J PRANAY REDDY
Abstract
An investigation about the genetic diversity among 68 wheat genotypes using 17 yield and yield traits was studied at the Agriculture Research Farm, Department of Plant Breeding and Genetics, Lovely Professional University, Phagwara (Punjab). Univariate and multivariate analysis of variance revealed the presence of significant variation among the genotypes. Based on D2 statistic, genotypes were grouped in 5 clusters following Tocher method. Cluster I consisting of 49 genotypes and was the largest one followed by cluster III, Cluster II, Cluster IV and Cluster V. Maximum intra-cluster distance was found in cluster III followed by cluster II and cluster I. The most divergent clusters indicated highest inter-cluster distance which was found between clusters II and III followed by clusters II and IV whereas lowest distance was between cluster I and V. For yield improvement, cluster II containing 5 genotypes exhibiting highest mean value for 1000 grains weight and cluster III containing 11 genotypes also exhibiting highest mean value for harvest index would be promising if taken for hybridization programmes. Protein content, days to 50% heading and plant height contributed maximum towards total divergence. The contribution of various characters towards the expression of genetic divergence should be taken into account as a criterion for selecting parents for wheat breeding programme for the improvement in such characters.
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